Modeling the Impact of Phonon Scattering with Strain Effects on the Electrical Properties of MoS<sub>2</sub> Field-Effect Transistors.

Micromachines (Basel) · 2023 · PMC10301306 · PMID 37374820

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closest p

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an increasing trendno p-value reported

Conversely, the on–off ratio demonstrates an increasing trend with high-k dielectrics.

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