Simulation Study on the Charge Collection Mechanism of FinFET Devices in Single-Event Upset.

Micromachines (Basel) · 2024 · PMC10890542 · PMID 38398930

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closest p

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The sentences

a decreasing trendno p-value reported

However, when the LET reaches 0.009 pC/μm, the transient pulse width of the drain current starts to exhibit a decreasing trend.

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