Research on the Reliability of Threshold Voltage Based on GaN High-Electron-Mobility Transistors.

Micromachines (Basel) · 2024 · PMC10972483 · PMID 38542568

Europe PMC DOI

hedged sentence

—

closest p

—

boldest claim

The sentences

a decreasing trendno p-value reported

an increasing trendno p-value reported

It was also observed that as the temperature increases, the V MS shows an increasing trend, while the V p-i-n shows a decreasing trend.

also in 47,180 other papers

Quoted from the open-access full text in Europe PMC under the licence the publisher applied. The sentence is reproduced exactly as published; the emphasis is ours.