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Optimization of Graphical Parameter Extraction Algorithm for Chip-Level CMP Prediction Model Based on Effective Planarization Length.

Micromachines (Basel) · 2024 · PMC11051990 · PMID 38675360

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an apparent trendno p-value reported
However, the topography of the transitional region between the arrays indicates an apparent trend, which is caused by the influence of different patterns on adjacent arrays.

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