A Comprehensive Analysis of Unclamped-Inductive-Switching-Induced Electrical Parameter Degradations and Optimizations for 4H-SiC Trench Metal-Oxide-Semiconductor Field-Effect Transistor Structures

Micromachines (Basel) · 2024 · PMC11205558

Europe PMC

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closest p

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a decreasing trendno p-value reported

The peak avalanche current presents a decreasing trend, while the avalanche duration gradually increases.

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