Impact of Total Ionizing Dose on Radio Frequency Performance of 22 nm Fully Depleted Silicon-On-Insulator nMOSFETs.

Micromachines (Basel) · 2024 · PMC11596861 · PMID 39597104

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a decreasing trendno p-value reported

It can be observed that with the increase in the TID level, g m shows a decreasing trend (approximately 9.7%) in the frequency range below 100 GHz, while the variation of g m is not significant in the frequency range above 100 GHz.

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