Microwave Dielectric Properties and Defect Behavior of xTiO<sub>2</sub>-(1-x)SiO<sub>2</sub> Glass.

Materials (Basel) · 2025 · PMC11766635 · PMID 39859791

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a decreasing trendno p-value reported

The calculated activation energy exhibited a decreasing trend with increasing TiO 2 content, consistent with the characteristics of doubly ionized oxygen vacancies, suggesting the involvement of identical charge carriers in the relaxation and conduction mechanisms.

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