A Critical Comparison Among High-Resolution Methods for Spatially Resolved Nano-Scale Residual Stress Analysis in Nanostructured Coatings.

Int J Mol Sci · 2025 · PMC11989771 · PMID 40244123

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may not be significantno p-value reported

The difference between the samples may not be significant, given the small sampling size associated with STEM analysis. 4.

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