Molecular Electronics Meets Direct-Write Carbon Nanofabrication via Focused Electron-Beam-Induced Deposition (FEBID): A Platform for Junction Architecture Design.

ACS Appl Electron Mater · 2025 · PMC12573786 · PMID 41179280

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may be significantno p-value reported

The relatively low in-plane conductivity of amorphous carbon and resulting ohmic potential losses may be significant when the nascent “large area” HOPG| 1′ |C-FEBID junction is connected to the external circuit for electrical measurements.

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