Microstructure and Optoelectronic Properties of WZO/Al/Cu/Al/WZO Multilayer Films.

Nanomaterials (Basel) · 2025 · PMC12655007 · PMID 41295618

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a decreasing trendno p-value reported

With the increase in Cu layer thickness, the carrier concentration and Hall mobility of the films gradually increased from 1.4 × 10 22 cm −3 and 0.3 cm 2 /V·s to 6.4 × 10 22 cm −3 and 1.4 cm 2 /V·s, respectively, and then the resistivity exhibited a decreasing trend.

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