Barely Significant
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The Formation Law of Surface Profile in Fused Silica During Continuous-Wave CO<sub>2</sub> Laser Processing.

Micromachines (Basel) · 2025 · PMC12734851 · PMID 41470494

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highly significantno p-value reported
Scan spacing d had a negative coefficient and was highly significant ( p -value = 0.00024585 < 0.05), indicating that an increase in d leads to a decrease in coefficient b.

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