The X-ray photoelectron spectroscopy (XPS) depth profiling indicates that the organic content on the FSI/PF-DMSF-derived SEI shows a decreasing trend as the etching depth increases, while the subsurface region is enriched with LiF and Li 2 S ( Fig. 4a ).
← all excerpts
Tailoring terminal groups in sulfonyl solvents to boost compatibility with lithium metal anodes.
1
—
—