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Modeling and simulation of ZnO-based TFTs by dielectric engineering and temperature analysis for enhanced performance.

Sci Rep · 2025 · PMC12804916 · PMID 41455711

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a slight trendno p-value reported
From this equation, we can write: 19 As HfO2 thickness increases, there is a slight trend of decreasing extracted as can be seen in Table 4 .

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