highly significantp=0.000
A highly significant positive correlation was found between device size and defect size measured by TTE, TEE, and balloon sizing (r=0.918–0.951; p=0.000) ( Table 2 ).
A highly significant positive correlation was found between device size and defect size measured by TTE, TEE, and balloon sizing (r=0.918–0.951; p=0.000) ( Table 2 ).