Machine-Learning-Assisted Buried-Window FET Sensors for High-Reliability and High-Sensitivity Applications.

Sensors (Basel) · 2026 · PMC12943850 · PMID 41755109

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an interesting trendno p-value reported

An interesting trend is observed: as the gate dielectric thickness decreases, the gate-to-channel coupling is enhanced, which reduces the subthreshold swing.

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