A Study on a Method for Detecting Surface Defects in Optical Modules Based on Information Entropy Feature Extraction

Entropy (Basel) · 2026 · PMC13297751

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highly significantno p-value reported

The results indicate a statistically significant difference between the two, with a p -value of 5.11 × 10 −9 (see Table 2 ) <0.001, confirming that the entropy distributions of the defect profile and the standard profile differ significantly at a highly significant level.

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