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High-temperature electrical performance and interface adhesion performance of SiC-based Pt thin-film RTDs.

Microsyst Nanoeng · 2026 · PMC13333942 · PMID 42402607

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an increasing trendno p-value reported
In summary, the TCR of the Ta/Pt combination exhibited an increasing trend as the temperature rose.

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a decreasing trendno p-value reported
The TCR of the Ta/Pt combination increased with annealing temperature, whereas the TCR of the Al2O3/Pt combination showed a decreasing trend with the annealing temperature.

also in 47,180 other papers

Quoted from the open-access full text in Europe PMC under the licence the publisher applied. The sentence is reproduced exactly as published; the emphasis is ours.