Geometry-aware localization evaluation of grad-CAM for wafer map defect classification.

Sci Rep · 2026 · PMC13424303 · PMID 42178329

Europe PMC DOI

hedged sentence

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closest p

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boldest claim

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highly significantp ≈ 0 .not a probability at all

Paired statistical testing confirmed that the increase was highly significant, with both the paired t-test and Wilcoxon signed-rank test yielding p ≈ 0 .

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