However, since the SC is primarily dependent on the inlet pore morphology at the membrane surface, verifying the structure of the inner membrane surface and its immediate vicinity using advanced cross-sectional techniques, such as focused ion beam scanning electron microscopy (FIB-SEM) [ 15 ] or cross-sectional ion-milling (CSIM) [ 13 ], would be highly significant for future validation.
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Correlation between real sieving coefficient determined using novel lab-scale module and pore structure of hemodiafiltration membranes.
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