Automatic defect detection for TFT-LCD array process using quasiconformal kernel support vector data description.

Int J Mol Sci · 2011 · PMC3189749 · PMID 22016625

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considerably significantno p-value reported

Experimental results carried out on real LCD images have indicated that the proposed QK-SVDD substantially improves generalization performance of SVDD in the LCD inspection application, and the improvement in generalization performance is considerably significant, over 30%.

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