Performing elemental microanalysis with high accuracy and high precision by scanning electron microscopy/silicon drift detector energy-dispersive X-ray spectrometry (SEM/SDD-EDS).

J Mater Sci · 2015 · PMC4555346 · PMID 26346887

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extremely significantno p-value reported

Qualitative analysis failures A separate but extremely significant issue is the reliability of elemental identification in the EDS spectrum.

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