A synchrotron X-ray diffraction deconvolution method for the measurement of residual stress in thermal barrier coatings as a function of depth.

J Appl Crystallogr · 2016 · PMC5139989 · PMID 27980507

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an increasing trendno p-value reported

, 2010 ▸ ) to obtain the residual stress distribution as a function of depth in TBCs where an increasing trend of compressive stress from the surface to the interface was found.

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