Crystal orientation-dependent fatigue characteristics in micrometer-sized single-crystal silicon.

Microsyst Nanoeng · 2016 · PMC6444710 · PMID 31057827

Europe PMC DOI

hedged sentence

—

closest p

—

boldest claim

The sentences

practically significantno p-value reported

These facts are practically significant for simplifying the reliability design of MEMS devices.

also in 1,558 other papers

Quoted from the open-access full text in Europe PMC under the licence the publisher applied. The sentence is reproduced exactly as published; the emphasis is ours.