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Characterization of Ti/SnO<sub>2</sub> Interface by X-ray Photoelectron Spectroscopy.

Nanomaterials (Basel) · 2022 · PMC8780820 · PMID 35055221

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a decreasing trendno p-value reported
From these figures it is observed that SnO 2 shows a decreasing trend while elemental Sn shows an increasing trend with the increase in the titanium overlayer.

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an increasing trendno p-value reported
The room temperature samples showed variation around 20% for the Ti-suboxide while an increasing trend was observed in the 200 °C samples. tin titanium tin oxide X-ray photoelectron spectroscopy pmc-status-qastatus 0 pmc-status-live yes pmc-status-embargo no pmc-status-released yes pmc-prop-open-access yes pmc-prop-olf no pmc-prop-manuscript no pmc-prop-legally-suppressed no pmc-prop-has-pdf yes pmc-prop-has-supplement no pmc-prop-pdf-only no pmc-prop-suppress-copyright no pmc-prop-is-real-version no pmc-prop-is-scanned-article no pmc-prop-preprint no pmc-prop-in-epmc yes pmc-license-ref CC BY 1.

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Quoted from the open-access full text in Europe PMC under the licence the publisher applied. The sentence is reproduced exactly as published; the emphasis is ours.