Low to high negative correlations were observed between the spot blotch rAUDPC values and days to heading in the different panels that ranged between −0.18 and −0.66 and were highly significant at a p -value threshold of 0.001.
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Genome-Wide Association Mapping Indicates Quantitative Genetic Control of Spot Blotch Resistance in Bread Wheat and the Favorable Effects of Some Spot Blotch Loci on Grain Yield.
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