Further support of In alloying was observed in room-temperature diffuse reflectance data, which displayed a decreasing trend in the optical bandgap measurements as the nominal In composition of the deposited films increased.
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Benchtop Electrochemical Growth and Controlled Alloying of Polycrystalline In <sub><i>x</i></sub> Ga<sub>1-<i>x</i></sub> As Thin Films.
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