OFF-State Leakage Suppression in Vertical Electron-Hole Bilayer TFET Using Dual-Metal Left-Gate and N<sup>+</sup>-Pocket.

Materials (Basel) · 2022 · PMC9573729 · PMID 36234264

Europe PMC DOI

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closest p

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an increasing trendno p-value reported

Therefore, I OFF exhibits an increasing trend.

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