A clear trend in the improvement of the surface smoothness as well as the FWHM of the GaAs peak (obtained with ω-RC scan) can be noticed, which follows an increase of As flux from process to process.
← all excerpts
Initial Optimization of the Growth Conditions of GaAs Homo-Epitaxial Layers after Cleaning and Restarting the Molecular Beam Epitaxy Reactor.
1
—
—