Structural Characterization of La0.6Sr0.4CoO3-δ Thin Films Grown on (100)-, (110)-, and (111)-Oriented La0.95Sr0.05Ga0.95Mg0.05O3-δ.

Materials (Basel) · 2024 · PMC11050905 · PMID 38673159

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closest p

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quite significantno p-value reported

The difference in the lattice parameters of the film and the precipitate is quite significant, where the precipitate has an 8.81% increase compared to the thin film in the free region.

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Structural Characterization of La<sub>0.6</sub>Sr<sub>0.4</sub>CoO<sub>3-<i>δ</i></sub> Thin Films Grown on (100)-, (110)-, and (111)-Oriented La<sub>0.95</sub>Sr<sub>0.05</sub>Ga<sub>0.95</sub>Mg<sub>0.05</sub>O<sub>3-<i>δ</i></sub>.

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