The results reveal a clear trend: as the value of δ increases, both ARL and SDRL tend to decrease, and conversely, as δ decreases, ARL and SDRL show an increasing pattern.
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Parameter free AEWMA control chart for dispersion in semiconductor manufacturing.
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The sentences
Upon examination of Tables 1 , 2 , 3 , and 4 , it is evident that the ARL values exhibit a decreasing trend with an increase in the dispersion shift.