Figure 22 displays the relationship between the characteristic lifetimes of various low- k dielectrics plotted against the applied electric field, revealing a clear trend of lower breakdown performance with decreasing k value.
← all excerpts
Comprehensive Review on the Impact of Chemical Composition, Plasma Treatment, and Vacuum Ultraviolet (VUV) Irradiation on the Electrical Properties of Organosilicate Films.
1
—
—