Looking again at the IV -characteristics in Figure a–c, the monoclinic stack shows the highest cycle-to-cycle variability in SET and RESET. Furthermore, a clear trend to higher device-to-device variability can be observed (see Supporting Information Figure S4 , where ten devices with each 200 DC cycles were measured).
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All HfO<sub><i>x</i></sub>-Resistive Switches with the Conducting Oxygen Vacancy Exchange Layer and Self-Limited Oxide Layer.
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