AFM profiling of free-standing thin films, transferred onto silicon wafers, further confirmed that thicknesses remained below 250 nm, with a clear trend of increasing thickness with longer IP reaction times and elevated FTCS concentrations (Fig. 2g, h , Fig.
← all excerpts
Subnanoporous hydrophobic thin films for ultrahigh-efficiency seawater and brines desalination using membrane distillation.
1
—
—