Impact of Fabrication Defects on FPGA Logic Using Memristor-Based Memory Cells.

Micromachines (Basel) · 2026 · PMC13118319 · PMID 42076206

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hedged sentence

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quite significantno p-value reported

Discussion Evaluation results clearly show that the number of defective LUTs is quite significant, even for small memristor defect rates and especially in the case of a uniform defect distribution.

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