Genome-wide association for grain morphology in synthetic hexaploid wheats using digital imaging analysis.

In the nutshell: i) grain roundness has significant negative relationship with grain length indicating both traits influencing grain weight independently; ii) horizontal and vertical deviations from optimal ellipse were positively correlated with grain length and width, respectively, indicating deviation from the ellipse enhances grain length and width, and ultimately TKW; iii) grain length and width had slightly significant positive correlation indicating the possibility of finding some SHWs having wider and lengthy grains simultaneously which may lead to above the average TKW.

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